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\customboldJ. L. Braid, Curran, A., Sun, J., Schneller, E., Fada, J., Liu, J., Wang, M., Longacre, A., Dai, J., Huey, B., Davis, K., Jaubert, J., & Bruckman, L.(2018).EL and I-V Correlation for Degradation of PERC vs. Al-BSF Commercial Modules in Accelerated Exposures..
