French, R. H., & Xu, Y. H.(1996).Critical point analysis of the interband transition strength of electrons.Journal of Physics D: Applied Physics,29(7),1740-1750.
French, R. H., & Müllejans, H. H.(1996).Interband electronic structure of a near- grain boundary in -alumina determined by spatially resolved valence electron energy-loss spectroscopy.Journal of Physics D: Applied Physics,29(7),1751-1760.
French, R. H., & Mo, S. H.(1996).Optical properties of a near-Sigma-11 a axis tilt grain boundary in alpha-Al2O3.Journal of Physics D: Applied Physics,29(7),1761-1766.
French, R. H., Ackler, H. H., & Chiang, Y. H.(1996).Comparisons of Hamaker Constants for Ceramic Systems with Intervening Vacuum or Water: From Force Laws and Physical Properties.Journal of Colloid and Interface Science,179(2),460-469.
Dehm, G., Nadarzinski, K., Ernst, F., & Rühle, M.(1996).Quantification of Irradiation Damage Generated During HRTEM with 1250keV Electrons.Ultramicroscopy,63, 49–55.
Ernst, F., Finnis, M., Gust, W., Koch, A., Schmidt, C., & Straumal, B.(1996).Structure and Energy of Twin Boundaries in Copper.Zeitschrift für Metallkunde,87, 911–922.
Ernst, F., Hofmann, D., Nadarzinski, K., Stemmer, S., & Streiffer, S.(1996).Quantitative High-Resolution Electron Microscopy of Interfaces.Transtec Publications Ltd..
Ernst, F., & Rühle, M.(1996).Structure of Twin Boundaries in Copper, Studied by Quantitative High-Resolution Transmission Electron Microscopy.The Japan Institute of Metals.
Nadarzinski, K., & Ernst, F.(1996).The Atomistic Structure of a =3, (111) Grain Boundary in NiAl, Studied by Quantitative High-Resolution Transmission Electron Microscopy.Philosophical Magazine A,74, 641–664.
French, R. H.(1995).Interfacial Electronic Structure and Full Spectral Hamaker Constants of {Si3N4} Intergranular Films from {VUV} and {SR-VEEL} Spectroscopy.Materials Research Society.
French, R. H., Wilson, S. H., Naqvi, S. H., McNeil, J. H., Marchman, H. H., Johs, B. H., & Kalk, F. H.(1995).Metrology of etched quartz and chrome embedded phase shift gratings using scatterometry.SPIE,2439
French, R. H.(1995). Full spectral calculation of non-retarded Hamaker constants for ceramic systems from interband transition strengths.Solid State Ionics,75, 13-33.
Stemmer, S., Streiffer, S., Ernst, F., Rühle, M., Hsu, W., & Nataraj, R.(1995).Domain Configurations in Ferroelectric PbTiO3 Thin Films: The Influence of Substrate and Film Thickness.Solid State Ionics,75, 43–48.
Stemmer, S., Streiffer, S., Hsu, W., Ernst, F., Nataraj, R., & Rühle, M.(1995).The Influence of Pt and SrTiO3 Interlayers on the Microstructure of PbTiO3 Thin Films Deposited by Laser Ablation on (001)MgO.Journal of Materials Research,10, 791–794.
Schmidt, C., Ernst, F., Finnis, M., & Vitek, V.(1995).Prediction and Observation of the BCC Structure in Pure Copper at a Sigma-3 Grain Boundary.Physical Review Letters,75, 2160–2163.
French, R. H.(1994).Quantitative Electronic Structure Analysis of {a-Al2O3} Using Spatially Resolved Valence Electron {Energy-Loss} Spectra.Mat. Res. Soc. Symp. Proc.
